Panalytical

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  X-RAY DIFFRACTION (XRD)

  X-ray diffraction (XRD) is a versatile, non-destructive technique that reveals detailed information about the chemical composition and crystallographic structure of natural and manufactured materials.

  
  
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  WAVELEGTH X-RAY FLUORESCENCE (WDXRF)

  X-ray spectrometry methods to measure elements are founded on Moseley's relationship, showing that the reciprocal of the wavelength of characteristic radiation for any given spectral line of a series (i.e. K, L, M etc.) is directly related to the square of the atomic number. These wavelengths are well documented. By measuring the wavelengths of characteristic X-radiation one can infer the atom from which it originates.

  
  
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  ENERGY DISPERSIVE X-RAY FLOURESCENCE (EDXRF)

  An energy dispersive X-ray fluorescence (EDXRF) spectrometer makes use of the fact that the pulse height of the detector signal is proportional to the X-ray photon energy, which is correlated with the wavelength. Therefore the optical path is simpler than for WDXRF spectrometers because no crystals or goniometers are needed and the fluorescence photons from the sample hit the detector directly.